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August 25-29, 2008 EPFL, Lausanne, Switzerland |
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| MONDAY, August 25 | ||
| 8:30-12:00 am | Noise Coupling in Mixed-Mode ICs: Mechanisms | Tim Schmerbeck, IBM |
| 1:30-3:00 pm | Noise Coupling in Mixed-Mode ICs: Simulation/Measurement | Tim Schmerbeck, IBM |
| 3:30-5:00 pm | Noise Coupling in Mixed-Mode ICs: Design Strategy/Hardware Example | Tim Schmerbeck, IBM |
| TUESDAY, August 26 | ||
| 8:30-10:00 am | Interference Effects: CMRR/PSRR | Michiel Steyaert, KU Leuven |
| 10:30-12:00 am | Opamp Design Towards Max. GBW PSRR | Michiel Steyaert, KU Leuven |
| 1:30-3:00 pm | Distortion | Michiel Steyaert, KU Leuven |
| 3:30-5:00 pm | Design for EMC | Michiel Steyaert, KU Leuven |
| WEDNESDAY, August 27 | ||
| 8:30-12:00 am | Technology and other Limitations for Analog Circuits | Herman Casier, Consultant |
| 1:30-5:00 pm | Reliability of ICs | Yusuf Leblebici, EPFL |
| THURSDAY, August 28 | ||
| 8:30-12:00 am | Sampled Noise in SC Circuits | Gabor Temes, OSU |
| 1:30-3:00 pm | Offset and CMRR: Random and Systematic | Willy Sansen, KU Leuven |
| 3:30-5:00 pm | ESD Protection | Yusuf Leblebici, EPFL |
| FRIDAY, August 29 | ||
| 8:30-12:00 am | MOS Transistor Modeling in Deep Submicron | Christian Enz, CSEM |
| 1:30-3:00 pm | Transistor-Level Utility Circuits | Paul Brokaw, Analog Devices |
| 3:30-5:00 pm | Design for Manufacturing Robustness | Barrie Gilbert, Analog Devices |