Layout and Design for Variability and High-Yield in Mixed-Signal ICs
JUNE 29 - JULY 2, 2009
EPFL, Lausanne, Switzerland
MONDAY, June 29
8:30 - 12:00 am Physical Device Variability Asen Asenov,
Univ. of Glasgow
1:30 - 3:00 pm Leakage Aware Design Wim Dehaene,
KU Leuven
3:30 - 5:00 pm Design for Variability in Memories Wim Dehaene,
KU Leuven
TUESDAY, June 30
8:30-10:00 am Dynamic Element Matching Ian Galton,
UC San Diego
10:30-12:00 am
& 1:30-3:00 pm
Digital Enhancement of Analog Circuits Ian Galton,
UC San Diego
3:30 - 5:00 pm Layout for RF Circuits John Cowles,
Analog Devices
WEDNESDAY, July 1
8:30-10:00 am Offset and CMRR: Design Strategies Towards Systematic and Random Effects Michiel Steyaert,
KU Leuven
10:30-12:00 am High Speed D/A Design : A Matching Story Michiel Steyaert,
KU Leuven
1:30 - 5:00 pm Reliability and Physical Design and Issues in Nanoscale Analog CMOS Technologies Lanny Lewyn,
Consultant
THURSDAY, July 2
8:30-10:00 am Reliability and Physical Design and Issues in Nanoscale Analog CMOS Technologies (continued) Lanny Lewyn,
Consultant
10:30 - 12:00 am Matching of MOS Transistors in Deep-Submicron Maarten Vertregt,
NXP Semiconductors
1:30 - 5:00 pm Layout Considerations in Mixed-Signal Circuit Design Maarten Vertregt,
NXP Semiconductors
FRIDAY, July 3
Optional Exams for ECTS Credits